发明名称 PLASMA PROCESSING APPARATUS AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide a plasma processing apparatus and method which can keep a working shape constant, with respect to the plasma processing apparatus and method which are suitable to the fine working of semiconductor devices. SOLUTION: The plasma processing apparatus has a processing container 1a forming a processing chamber 1, processing-gas feeding apparatuses 3, 4 for feeding a processing gas to the inside of the processing chamber 1, a plasma generating means 2 for so feeding an electromagnetic energy to the inside of the processing chamber as to generate a plasma by dissociating the plasma gas fed to the inside of the processing chamber, and a means 12 for heating or cooling the vacuum processing container, and it subjects a wafer carried to the inside of the processing chamber to a plasma processing. Further, there is provided in it a processing-chamber-surface-temperature controlling portion 15 for controlling the inner-surface temperature of the processing chamber, and prior to a wafer processing performed after a cleaning processing, the controlling portion so generates the plasma in the inside of the processing chamber by using a processing time set previously according to a processing hysteresis as to heat the inner surface of the processing chamber and as to control the inner-surface temperature of the processing chamber. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005244065(A) 申请公布日期 2005.09.08
申请号 JP20040054229 申请日期 2004.02.27
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 TANAKA JUNICHI;KITSUNAI HIROYUKI;YAMAMOTO HIDEYUKI;IKUHARA SHIYOUJI;KAGOSHIMA AKIRA
分类号 H01L21/3065;C23F1/00;H01L21/00;H01L21/26;H01L21/306;(IPC1-7):H01L21/306 主分类号 H01L21/3065
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