发明名称 Integrated circuit package with keep-out zone overlapping undercut zone
摘要 An integrated circuit package is provided with a connective structure having a wire bonding zone and a keep-out zone. An integrated circuit die has an undercut defining an undercut zone, which is overlapped by the keep-out zone. A wire is bonded between the integrated circuit die and the connective structure within the wire bonding zone and outside of the keep-out zone.
申请公布号 US2005194698(A1) 申请公布日期 2005.09.08
申请号 US20040794109 申请日期 2004.03.03
申请人 ST ASSEMBLY TEST SERVICE LTD. 发明人 SHIM IL KWON;ARARAO VIRGIL C.;HUR HYEONG R.;HAN BYUNG J.
分类号 H01L23/48;(IPC1-7):H01L23/48 主分类号 H01L23/48
代理机构 代理人
主权项
地址