发明名称 POSITIVE RESIST COMPOSITION AND RESIST PATTERN FORMING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a positive resist composition capable of forming a high resolution resist pattern with good rectangularity and reduced LER, and to provide a pattern forming method using the positive resist composition. <P>SOLUTION: In the positive resist composition containing a resin component (A) having an acid-dissociable dissolution inhibiting group and alkali solubility increased by the action of an acid and an acid generator component (B) which generates an acid upon exposure, the resin component (A) contains a copolymer (A1) comprising a constitutional unit (a1) represented by formula (I), wherein part of the hydroxyl groups is protected by replacing the hydrogen atom thereof with the above acid-dissociable dissolution inhibiting group, and a constitutional unit (a2) represented by formula (II), and having a mass average molecular weight of &le;16,000. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005242216(A) 申请公布日期 2005.09.08
申请号 JP20040054914 申请日期 2004.02.27
申请人 TOKYO OHKA KOGYO CO LTD 发明人 TANI KAZUO;YAMAZAKI AKIYOSHI;MOTOIKE NAOTO;ZENSEI SATOSHI;YOSHIZAWA SACHIKO
分类号 G03F7/039;C08F212/14;C08F220/18;G03F7/033;H01L21/027 主分类号 G03F7/039
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