| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a TFT array and its testing device capable of measuring an amount of current of a transistor for driving and testing presence/absence of defects of pixels at a state close to an actual use state in current copy type pixels. <P>SOLUTION: The above problem is solved by the TFT array having pixels each equipped with a transistor which controls the amount of current, a capacitor connected between a gate terminal and a source terminal of the transistor, a first switch connected between the gate terminal and a drain terminal of the transistor, a first control line which controls the first switch, a second switch one end of which is connected to the drain terminal of the transistor and a second control line which controls the second switch. <P>COPYRIGHT: (C)2005,JPO&NCIPI |
