| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a SOC with a built-in self-test circuit and a self-test method therefor. <P>SOLUTION: This SOC with built-in self-test circuit comprises an IP block including a BIST logic circuit and a BIST control part. The BIST logic circuit is operated in a normal mode or a test mode in response to control data received through a system bus to output test result data in the test mode. The BIST control part transmits, in the test mode, control data, a command signal, test pattern data and a test address signal to the BIST logic circuit through the system bus to test the IP block, and compresses and stores the test result data received through the system bus. According to this, the test is performed at the operation speed of the SOC to shorten the test time, and even after the SOC is mounted on a board, the test can be performed. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p> |
