发明名称 Exposure apparatus and method
摘要 A production method of a semiconductor device which includes the steps of exposing a resist coated on a substrate of a semiconductor device by projecting a first light pattern on the substrate of the semiconductor device the first light pattern being formed by passing light through a first mask, and exposing the resist by projecting a second light pattern on the substrate, the second light pattern being formed by passing light through a second mask. In the step of exposing the resist by projecting the second light pattern, the second light pattern is formed by excimer laser light having an annular shape and passed through the second mask.
申请公布号 US2005196713(A1) 申请公布日期 2005.09.08
申请号 US20050117447 申请日期 2005.04.29
申请人 NOGUCHI MINORI;KENBO YUKIO;OSHIDA YOSHITADA;SHIBA MASATAKA;YOSHITAKA YASUHIRO;MURAYAMA MAKOTO 发明人 NOGUCHI MINORI;KENBO YUKIO;OSHIDA YOSHITADA;SHIBA MASATAKA;YOSHITAKA YASUHIRO;MURAYAMA MAKOTO
分类号 G03F1/08;G03F1/84;G03F7/20;H01L21/027;H01L21/30;(IPC1-7):G03F7/00 主分类号 G03F1/08
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