发明名称 DOPING MASK AND METHODS FOR MANUFACTURING CHARGE TRANSFER IMAGE DEVICE AND SEMICONDUCTOR ELEMENT USING IT
摘要 PROBLEM TO BE SOLVED: To provide a doping mask for forming wells having different concentrations in a single ion implantation operation, and methods for manufacturing a charge transfer image device and a semiconductor element using the doping mask. SOLUTION: A peripheral circuit region B on a substrate 10 has no photoresist film. A photoresist pattern PR in which openings 50 are repeatedly formed at a predetermined pitches is formed in a pixel region A. Ions are implanted at the same concentration level into the entire surface of the substrate 10 by using the photoresist pattern PR as a doping mask, and subsequently an annealing operation is performed. The pitch a in the photoresist pattern PR is a width where ions implanted through the doping mask diffuse toward those implanted through an adjacent opening 50 to form wells. Thus, well regions having different concentrations can be formed at the same time. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005244217(A) 申请公布日期 2005.09.08
申请号 JP20050039111 申请日期 2005.02.16
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 LEE SEOK-HA
分类号 H01L21/00;H01L21/027;H01L21/265;H01L21/266;H01L27/148;H01L31/10;(IPC1-7):H01L21/266 主分类号 H01L21/00
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