| 摘要 |
PROBLEM TO BE SOLVED: To reduce an image defect due to fluctuation of gate voltage between mutual thin film transistors in a sampling circuit in an electrooptical apparatus such as a liquid crystal display. SOLUTION: In the sampling circuit constituted of a plurality of thin film transistors 20 wherein sampling circuit driving signals are connected to gate electrodes and sampling n pieces of image signals SV1 to n formed by serial-parallel-conversion input image signals to drive a plurality of data lines 3 respectively, channel widths Wch of the plurality of thin film transistors 20 are made different from each other and characteristics are adjusted according to wiring lengths of the sampling circuit driving signals so that difference between voltage drops of the sampling circuit driving signals caused by the difference of the wiring lengths can be compensated. COPYRIGHT: (C)2005,JPO&NCIPI
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