发明名称 Method of wafer level chip scale packaging
摘要 The invention includes a method of wafer level chip scale packaging including providing a semiconductor device having a silicon based substrate with discrete devices defined therein and a contact pad near an upper surface thereof, a passivation layer overlying the silicon based substrate and the contact pad, and the passivation layer having an opening therein exposing at least a portion of the contact pad, and a redistribution trace electrically connected to the contact pad near a first end and having a second end of spaced a distance from the contact pad. Forming an encapsulation layer over the semiconductor device including the redistribution trace. Forming an opening in the encapsulation layer down to the redistribution trace. Forming a contact post in the opening in the encapsulation layer, and the contact post having a first end electrically connected to the redistribution trace and a second exposed end. Forming an electrically conductive bump on the semiconductor device and in electrical contact with the contact post.
申请公布号 US6939789(B2) 申请公布日期 2005.09.06
申请号 US20020144074 申请日期 2002.05.13
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 HUANG CHENDER;TSAO PEI-HAW;WANG JONES;CHEN KEN
分类号 H01L23/31;H01L23/485;(IPC1-7):H01L21/44 主分类号 H01L23/31
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