发明名称 DRAM cell arrangement with vertical MOS transistors, and method for its fabrication
摘要 DRAM cell arrangement with vertical MOS transistors, and method for its fabrication. Channel regions arranged along one of the columns of a memory cell matrix are parts of a rib which is surrounded by a gate dielectric layer. Gate electrodes of the MOS transistors belonging to one row are parts of a strip-like word line, so that at each crossing point of the memory cell matrix there is a vertical dual-gate MOS transistor with gate electrodes of the associated word line formed in the trenches on both sides of the associated rib.
申请公布号 US6939763(B2) 申请公布日期 2005.09.06
申请号 US20030720730 申请日期 2003.11.24
申请人 INFINEON TECHNOLOGIES AG 发明人 SCHLOESSER TILL;LEE BRIAN S.
分类号 H01L21/02;H01L21/336;H01L21/8242;H01L27/108;H01L27/12;H01L29/786;(IPC1-7):H01L21/824 主分类号 H01L21/02
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