发明名称 |
DRAM cell arrangement with vertical MOS transistors, and method for its fabrication |
摘要 |
DRAM cell arrangement with vertical MOS transistors, and method for its fabrication. Channel regions arranged along one of the columns of a memory cell matrix are parts of a rib which is surrounded by a gate dielectric layer. Gate electrodes of the MOS transistors belonging to one row are parts of a strip-like word line, so that at each crossing point of the memory cell matrix there is a vertical dual-gate MOS transistor with gate electrodes of the associated word line formed in the trenches on both sides of the associated rib.
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申请公布号 |
US6939763(B2) |
申请公布日期 |
2005.09.06 |
申请号 |
US20030720730 |
申请日期 |
2003.11.24 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
SCHLOESSER TILL;LEE BRIAN S. |
分类号 |
H01L21/02;H01L21/336;H01L21/8242;H01L27/108;H01L27/12;H01L29/786;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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