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发明名称
制造半导体装置之方法
摘要
一种形成半导体储存元件的方法,该方法包括下列步骤:在一氧化环境中将掺杂物以离子植入一半导体基底中,以形成一扩散区;以及形成复数个记忆体单元,其中各记忆体单元分别具有一金氧半导体(MOS)电晶体,各金氧半导体电晶体分别包括以扩散区形成之源极与汲极。
申请公布号
TW200529378
申请公布日期
2005.09.01
申请号
TW094102075
申请日期
2005.01.21
申请人
尔必达存储器股份有限公司
发明人
小此木坚佑;大汤静宪
分类号
H01L21/8239
主分类号
H01L21/8239
代理机构
代理人
洪澄文
主权项
地址
日本
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