发明名称 METHOD OF ELEMENTAL ANALYSIS
摘要 <p>A method of elemental analysis that is capable of striking enhancement of measuring accuracy. There is provided a method of elemental analysis, comprising converting a sample containing an element as measuring object to a multiply-charged ion by means of a multiply-charged ion source, carrying out measurement of mass spectra exhibiting a total ionization spectrum and/or multiply-charged ion valence distribution spectrum with respect to the element having been converted to multiply-charged ion by means of a mass spectrometer, and analyzing the element as measuring object on the basis of the measured mass spectra of the element having been converted to multiply-charged ion. This method of elemental analysis can attain improvement to various problems on elemental analysis having been encountered in the conventional technology and can contribute toward progress in extensive fields, such as medical science, archeology, environmentology and space physics.</p>
申请公布号 WO2005080959(A1) 申请公布日期 2005.09.01
申请号 WO2005JP02000 申请日期 2005.02.10
申请人 RIKEN;KIDERA, MASANORI;TAKAHASHI, KAZUYA;NAKAGAWA, TAKAHIDE;ENOMOTO, SHUICHI 发明人 KIDERA, MASANORI;TAKAHASHI, KAZUYA;NAKAGAWA, TAKAHIDE;ENOMOTO, SHUICHI
分类号 G01N27/62;H01J49/10;H01J49/26;(IPC1-7):G01N27/62 主分类号 G01N27/62
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