PHOTORESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN
摘要
<p>A photoresist composition which contains a fullerene derivative (A) having two or more malonic ester residues. The malonic ester residues preferably are groups represented by the following general formula (1): [Chemical formula 1] wherein R<1> and R<2> may be the same or different and each independently is alkyl. The alkyl preferably is one selected among C1-10 linear, branched, and cyclic alkyls. Symbol n preferably is an integer of 2 to 10.</p>
申请公布号
WO2005081061(A1)
申请公布日期
2005.09.01
申请号
WO2005JP01392
申请日期
2005.02.01
申请人
TOKYO OHKA KOGYO CO., LTD.;OGATA, TOSHIYUKI;HOJO, TAKUMA;TSUJI, HIROMITSU;HIROSAKI, TAKAKO;SATO, MITSURU