发明名称 PHOTORESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN
摘要 <p>A photoresist composition which contains a fullerene derivative (A) having two or more malonic ester residues. The malonic ester residues preferably are groups represented by the following general formula (1): [Chemical formula 1] wherein R&lt;1&gt; and R&lt;2&gt; may be the same or different and each independently is alkyl. The alkyl preferably is one selected among C1-10 linear, branched, and cyclic alkyls. Symbol n preferably is an integer of 2 to 10.</p>
申请公布号 WO2005081061(A1) 申请公布日期 2005.09.01
申请号 WO2005JP01392 申请日期 2005.02.01
申请人 TOKYO OHKA KOGYO CO., LTD.;OGATA, TOSHIYUKI;HOJO, TAKUMA;TSUJI, HIROMITSU;HIROSAKI, TAKAKO;SATO, MITSURU 发明人 OGATA, TOSHIYUKI;HOJO, TAKUMA;TSUJI, HIROMITSU;HIROSAKI, TAKAKO;SATO, MITSURU
分类号 G03F7/004;G03F7/038;G03F7/039;(IPC1-7):G03F7/004 主分类号 G03F7/004
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