摘要 |
<p>A method for screening PTC elements having different resistance-to-temperature characteristics, wherein a predetermined voltage is applied to each of PTC elements (A,B) in such a manner that the corresponding current sufficiently attenuates, and the PTC elements are screened based on a difference between times in which the currents flowing through the PTC elements (A,B) reach a predetermined current value (e.g., 52 mA).</p> |
申请人 |
MURATA MANUFACTURING CO.,LTD.;NAGAO, YOSHITAKA;IBATAGI, HIROSHI;IKEDA, YUTAKA;MIYAGAWA, KAZUTO;ABE, YOSHIAKI |
发明人 |
NAGAO, YOSHITAKA;IBATAGI, HIROSHI;IKEDA, YUTAKA;MIYAGAWA, KAZUTO;ABE, YOSHIAKI |