发明名称 PTC ELEMENT SCREENING METHOD
摘要 <p>A method for screening PTC elements having different resistance-to-temperature characteristics, wherein a predetermined voltage is applied to each of PTC elements (A,B) in such a manner that the corresponding current sufficiently attenuates, and the PTC elements are screened based on a difference between times in which the currents flowing through the PTC elements (A,B) reach a predetermined current value (e.g., 52 mA).</p>
申请公布号 WO2005081270(A1) 申请公布日期 2005.09.01
申请号 WO2004JP17233 申请日期 2004.11.19
申请人 MURATA MANUFACTURING CO.,LTD.;NAGAO, YOSHITAKA;IBATAGI, HIROSHI;IKEDA, YUTAKA;MIYAGAWA, KAZUTO;ABE, YOSHIAKI 发明人 NAGAO, YOSHITAKA;IBATAGI, HIROSHI;IKEDA, YUTAKA;MIYAGAWA, KAZUTO;ABE, YOSHIAKI
分类号 H01C7/02;(IPC1-7):H01C7/02;H01C17/00 主分类号 H01C7/02
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