Test switching circuit for a high speed data interface

摘要

Test switching circuit for a high speed data interface ( 1 ) of an integrated circuit comprising switching transistors (T 1 -T 6 ) which switch in a test mode a termination resistor output stage ( 15 ) of a data transmission signal path ( 17 ) to a termination resistor input stage ( 18 ) of a data reception signal path ( 25 ) to form an internal feedback test loop within said integrated circuit.