发明名称 Production of a first contact hole of a memory component comprises forming a semiconductor substrate having a cell field region and a logic region, producing an insulating layer on the semiconductor surface, and further processing
摘要 <p>Production of a first contact hole of a memory component comprises forming a semiconductor substrate (10) having a cell field region (20) and a logic region (30), producing an insulating layer (11) on the semiconductor surface, forming a sacrificial layer (12) on the insulating layer, depositing a fist mask layer, structuring the first mask layer to form first mask layer covers, anisotropically etching the sacrificial layer to expose the insulating layer, removing the first mask layer covers, depositing a second mask layer (16), structuring the second mask layer to form second mask layer covers, anisotropically etching the sacrificial layer to expose the insulating layer, removing the second mask layer covers, producing a filler layer between the blocks formed by the sacrificial layer, etching the sacrificial layer to remove the blocks in the filler layer, removing the exposed insulating layer, and filling contact opening regions with a conducting material.</p>
申请公布号 DE102004019786(B3) 申请公布日期 2005.09.01
申请号 DE20041019786 申请日期 2004.04.23
申请人 INFINEON TECHNOLOGIES AG 发明人 GRAF, WERNER;HEINECK, LARS
分类号 H01L21/60;H01L21/768;H01L21/8242;H01L27/108;(IPC1-7):H01L21/824 主分类号 H01L21/60
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