发明名称 Testing apparatus
摘要 A testing apparatus including a plurality of testing module slots to which different types of testing modules for testing a device under test are optionally mounted, includes operation order holding means for holding information indicating that a test operation by a first testing module among the plurality of testing modules should be performed before a test operation by a second testing module among the plurality of testing modules, trigger return signal receiving means for receiving a trigger return signal from the first testing module, the trigger return signal indicating that the first testing module has completed the test operation thereof, when the test operation of the first testing module has been completed, and trigger signal supplying means for supplying a trigger signal to the second testing module, the trigger signal indicating that the second testing module should start the test operation thereof, when the trigger return signal receiving means receives the trigger return signal.
申请公布号 US2005193298(A1) 申请公布日期 2005.09.01
申请号 US20040773562 申请日期 2004.02.06
申请人 ADVANTEST CORPORATION 发明人 INABA KENJI;MIYAZAKI MASASHI
分类号 G01R31/28;G01R31/3167;G01R31/319;G06F11/00;(IPC1-7):G01R31/28 主分类号 G01R31/28
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