Semiconductor integrated circuit detecting glitch noise and test method of the same

摘要

A semiconductor integrated circuit having a plurality of wirings and a scan chain including a testing circuit configured to detect glitch noise caused by crosstalk between the wirings and a plurality of scan flip-flops connected in series, the semiconductor integrated circuit includes a retention circuit receiving a data signal propagating a test-subject wiring, and a detection circuit receiving the data signal and an output signal of the retention circuit, detecting glitch noise occurring in the data signal, and delivering an output signal to the retention circuit.