发明名称 Method for manufacturing thin film transistor
摘要 Prior to converting a non-single crystal material of a semiconductor film into a single crystal material through the use of a laser beam, at least one dopant is introduced into whole of the semiconductor film. Then, the non-single crystal semiconductor film is irradiated with a laser beam to crystallize the semiconductor film. In this case, a ratio between quasi-fermi level of the single crystal material within one of transistor formation regions used to form transistors of different conductivity types and quasi-fermi level of the single crystal material within the other thereof is made to be between 0.5:1 and 2.0:1. Thus, transistors of different conductivity types are formed in the crystallized semiconductor film.
申请公布号 US2005191796(A1) 申请公布日期 2005.09.01
申请号 US20050102765 申请日期 2005.04.11
申请人 NEC LCD TECHNOLOGIES, LTD. 发明人 TAKAHASHI MITSUASA
分类号 C30B1/00;H01L21/20;H01L21/268;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/786;(IPC1-7):H01L21/00 主分类号 C30B1/00
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