发明名称 |
Apparatus for surface inspection and method and apparatus for inspecting substrate |
摘要 |
A target object has its surface condition inspected by having its image taken from above while being irradiated by red, green and blue light beams at different elevation angles. An inspection area is set on the image and a direction is extracted on the image in which a change appears in the color phase according to the arrangement of the light sources and this extracted direction is compared with a preliminarily registered standard direction to judge the surface condition from the result of this comparison. |
申请公布号 |
EP1568985(A2) |
申请公布日期 |
2005.08.31 |
申请号 |
EP20050003164 |
申请日期 |
2005.02.15 |
申请人 |
OMRON CORPORATION |
发明人 |
ISHIBA, MASATO;KURIYAMA, JUN;MURAKAMI, KIYOSHI;YOTSUYA, TERUHISA |
分类号 |
G01N21/956;G01B11/24;G01N21/00;G01N21/88;G01R31/308;G01R31/309;G06T7/00;G06T7/40;H05K3/34 |
主分类号 |
G01N21/956 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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