A method in which thermal mass and manufacturing differences are compensated for in thermometry probes by storing characteristic data relating to individual probes into an EEPROM for each probe which is used by the temperature apparatus.
申请公布号
EP1567842(A1)
申请公布日期
2005.08.31
申请号
EP20030776367
申请日期
2003.10.14
申请人
WELCH ALLYN, INC.
发明人
QUINN, DAVID, E.;BURDICK, KENNETH, J.;STONE, RAY, D.;LANE, JOHN;CUIPYLO, WILLIAM, N.
