| 发明名称 |
Non-invasive, low pin count test circuits and methods |
| 摘要 |
A method of testing an integrated circuit including the steps of observing a selected parameter at a selected test mode to detect an error. The current to the integrated circuit is stepped from a reference level by selected amount.
|
| 申请公布号 |
US6937046(B1) |
申请公布日期 |
2005.08.30 |
| 申请号 |
US20010027187 |
申请日期 |
2001.12.20 |
| 申请人 |
CIRRUS LOGIC, INC. |
发明人 |
KEJARIWAL MURARI;AMMISETTI PRASAD;THOMSEN AXEL;MELANSON JOHN LAURENCE |
| 分类号 |
G01R31/28;(IPC1-7):G01R31/02 |
主分类号 |
G01R31/28 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
|
| 地址 |
|
