| 摘要 |
PROBLEM TO BE SOLVED: To provide a component analysis method and a component analyzer having a simple procedure of analysis operation, capable of analyzing in a short time, and performing analysis processing at low cost. SOLUTION: In this component analysis method and this component analyzer, while supplying helium gas to an atmospheric pressure plasma source 2 arranged close to an analysis object body, a high-frequency power is supplied from a power source 4, and thereby plasma 5 is generated, and light is emitted from the analysis object body exposed to the plasma 5. The light is guided to a filter 7 and a photodiode 8 through an optical fiber 6, and subjected to photoelectric conversion. The analyzer is constituted so that a photoelectrically converted signal is transferred to a control device 9, and that the control device 9 determines whether a specific element is included in the analysis object body or not. COPYRIGHT: (C)2005,JPO&NCIPI
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