Maintenance of the state of a microelectronic circuit, in which certain circuit sections can be turned off, whereby a scan chain used for circuit testing is also used to collect register contents and then shift them into memory

摘要

Method for maintaining a state of a microelectronic circuit, e.g. during switching between standby and active modes, whereby at least a scan chain (14; 14a-c) is used to test the circuit (2). The at least one scan chain is also used to maintain the circuit state in that the contents of the at least one scan chain are moved into a memory (3). An independent claim is made for a device for maintaining a state of a microelectronic circuit.