发明名称 Process for the generation of intensive short wavelength plasma emissions for EUV lithography
摘要 <p>The target generator [1] produces an injection jet [2] that is directed into a vacuum chamber [12]. An additional energy beam [32] and high energy beam [31] are introduced and interact with the target jet. The pulsed energy beams produce shock waves [26,27]resulting in plasma generation [41].</p>
申请公布号 DE102004005242(A1) 申请公布日期 2005.08.25
申请号 DE20041005242 申请日期 2004.01.30
申请人 XTREME TECHNOLOGIES GMBH 发明人 GAEBEL, KAI;ZIENER, CHRISTIAN;HERGENHAN, GUIDO
分类号 G21K5/08;G03F7/20;G21B1/00;H01L21/027;H05G2/00;(IPC1-7):H05G2/00 主分类号 G21K5/08
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