发明名称 THREE-DIMENSIONAL MEASURING DEVICE, THREE-DIMENSIONAL MEASURING METHOD, AND THREE-DIMENSIONAL MEASURING PROGRAM
摘要 PROBLEM TO BE SOLVED: To provide a three-dimensional measuring device largely lessening a phase skip without damaging resolution. SOLUTION: The three-dimensional measuring device comprises an imaging device 350 for projecting a periodic light and shade pattern having a first pitch on an object to be measured and acquiring a plurality of captured images different in a phase of the object to be measured, a light intensity extraction part 310 for supposing light intensity of a pixel included in each of the plurality of the imaging images as a plurality of light intensity functions, a bias deletion calculation part 311 for removing a bias component by generating a plurality of combinations of the two light intensity functions different in the phases from the plurality of the light intensity functions and calculating a plurality of basic functions, a moire generation calculation part 312 for multiplying a plurality of memory grating functions in each of the plurality of the basic functions and calculating a plurality of moire functions, and a phase operation part 313 for removing a frequency component of a sum by generating the plurality of the combinations of the two moire functions equal to an absolute value of the frequency component of the sum mutually from the plurality of the moire functions and calculating an initial phase. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005227246(A) 申请公布日期 2005.08.25
申请号 JP20040049681 申请日期 2004.02.25
申请人 YAMATAKE CORP 发明人 FURUYA MASA;FUJIWARA HISATOSHI
分类号 G01B11/24;G01B11/25;G06T1/00;(IPC1-7):G01B11/24 主分类号 G01B11/24
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