发明名称 Positional measurement system and lens for positional measurement
摘要 A positional measurement system includes an electromagnetic wave source which emits an electromagnetic wave, a lens system which has a first lens surface, an electromagnetic wave shield section provided around a center axis of the first lens surface, and a second lens surface, and causes the electromagnetic wave having entered by way of the first lens surface exclusive of the electromagnetic wave shield section to exit from the second lens surface, to form an electromagnetic wave concentrated area at a position opposite the electromagnetic wave source, a receiving device which detects the electromagnetic wave concentrated area formed by the lens system, and a computing device which measures a position of the electromagnetic wave source based on information detected by the receiving device on the electromagnetic wave concentrated area.
申请公布号 US2005185195(A1) 申请公布日期 2005.08.25
申请号 US20040940766 申请日期 2004.09.15
申请人 FUJI XEROX CO., LTD. 发明人 SEKO YASUJI
分类号 G01B11/00;G01B15/00;G01B21/00;G01C3/06;G01S5/02;G01S5/16;(IPC1-7):G01B11/14 主分类号 G01B11/00
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