发明名称 IMAGE ENHANCEMENT FOR MULTIPLE EXPOSURE BEAMS
摘要 An aspect of the present invention includes a method for patterning a workpiece covered at least partly with a layer sensitive to electromagnetic radiation by using a plurality of exposure beams having a predetermined separation in at least a first direction for exposing a pattern onto said workpiece, where said predetermined separation is fixed to an initial system pitch in said first direction, comprising the actions of: scaling a pattern pitch in said first direction to be an integer multiple of said system pitch, adjusting the initial system pitch in said first direction to be an adjusted system pitch to maintain a scale of said pattern, adjusting said predetermined separation of exposure beams to said adjusted system pitch. Other aspects of the present invention are reflected in the detailed description, figures and claims.
申请公布号 WO2005078527(A1) 申请公布日期 2005.08.25
申请号 WO2005SE00077 申请日期 2005.01.25
申请人 MICRONIC LASER SYSTEMS AB;EKBERG, PETER 发明人 EKBERG, PETER
分类号 G03F7/00;G03F7/20 主分类号 G03F7/00
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