<p>A semiconductor photodetector (avalanche photodiode) which provides a high-sensitivity element by being incorporated with a multiplication layer having high-performance multiplication characteristics. A structure reducing an electric field applied to an etching stopper layer is used to permit the use of a multiplication layer (multiplication layer multiplied with a high electric field) having higher-performance multiplication characteristics. A first method to implement this is to use a conductive multiplication layer; and a second method is to use a structure in which a conductive electric-field relaxation layer is incorporated. These methods produce such a structure that can apply an electric field lower than a multiplication electric field to an etching stopper layer.</p>
申请公布号
WO2005078809(A1)
申请公布日期
2005.08.25
申请号
WO2005JP01702
申请日期
2005.02.04
申请人
NEC CORPORATION;NEC COMPOUND SEMICONDUCTOR DEVICES, LTD.;NAKATA, TAKESHI;MAKITA, KIKUO;SHONO, ATSUSHI