| 摘要 |
PROBLEM TO BE SOLVED: To realize a semiconductor device capable of surely maintaining potential set by cutting off a fuse and capable of improving reliability. SOLUTION: A fuse and logical circuit 1 is constituted of protective elements 3, 4, capacitors C1-C3, fuses FUSE1-FUSE3, test terminals TPAD1-TPAD3, and an OR-circuit OR1. COPYRIGHT: (C)2005,JPO&NCIPI
|
