发明名称 CHARGE STORAGE MEMORY AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To attain a memory cell miniaturization and the protraction of a data retention time duration. SOLUTION: A constitution is formed in which a bottom barrier layer 4, a first charge storage layer 5, a second charge storage layer 6, a top barrier layer 7, and a gate electrode 8 are sequentially laminated on a semiconductor substrate 1. The density of the localized level of the second charge storage layer 6 is made higher than that of the localized level of the first charge storage layer 5. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005228760(A) 申请公布日期 2005.08.25
申请号 JP20040032849 申请日期 2004.02.10
申请人 NIPPON TELEGR & TELEPH CORP <NTT>;NTT ADVANCED TECHNOLOGY CORP 发明人 NAKADA SHUNJI;SAITO KUNIO;SHIMADA MASARU;KATAGIRI YOSHIMASA;ENOMOTO YOICHI
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 H01L21/8247
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