发明名称 DRAM storage cell, formed by producing trench capacitors in a semiconductor substrate, and applying a mask to enable gate sections to be formed
摘要 <p>Producing a DRAM storage cell (2) unit, with a trench capacitor (3) and a FET, comprises forming trench capacitors in a semiconductor substrate (1), in rows (63). Neighbouring rows are displaced with respect to each other, and insulating structures (61') are arranged between them. A mask is applied to enable gate sections to be formed in the gate insulation structures. The primary mask material is poly silicon, while the secondary mask material consists of undoped poly silicon.</p>
申请公布号 DE102004006520(A1) 申请公布日期 2005.08.25
申请号 DE20041006520 申请日期 2004.02.10
申请人 INFINEON TECHNOLOGIES AG 发明人 GRUENING- VON SCHWERIN, ULRIKE
分类号 H01L21/334;H01L21/8242;H01L27/108;H01L29/786;H01L29/94;(IPC1-7):H01L21/824 主分类号 H01L21/334
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