发明名称 |
DRAM storage cell, formed by producing trench capacitors in a semiconductor substrate, and applying a mask to enable gate sections to be formed |
摘要 |
<p>Producing a DRAM storage cell (2) unit, with a trench capacitor (3) and a FET, comprises forming trench capacitors in a semiconductor substrate (1), in rows (63). Neighbouring rows are displaced with respect to each other, and insulating structures (61') are arranged between them. A mask is applied to enable gate sections to be formed in the gate insulation structures. The primary mask material is poly silicon, while the secondary mask material consists of undoped poly silicon.</p> |
申请公布号 |
DE102004006520(A1) |
申请公布日期 |
2005.08.25 |
申请号 |
DE20041006520 |
申请日期 |
2004.02.10 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
GRUENING- VON SCHWERIN, ULRIKE |
分类号 |
H01L21/334;H01L21/8242;H01L27/108;H01L29/786;H01L29/94;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/334 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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