发明名称 DESIGN METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT, AND DESIGN APPARATUS AND INSPECTION APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit, capable of preventing the alienation of the voltage of an operating signal from a power supply voltage/ground voltage and the propagation of the operating signal to post-stages so as to secure the operating stability of the circuit, and to prevent the leakage current of transistors. SOLUTION: In order to prevent the voltage of the operating signal applied to the semiconductor integrated circuit from being alienated from the power supply voltage/ground voltage in the design method of the semiconductor integrated circuit, transistors having high thresholds or circuit components having few parallel configurations are adopted, in place of circuit elements arranged in the semiconductor integrated circuit of prior arts. Also, transistors, having high thresholds or circuit components having few parallel configurations are adopted in place of circuit elements, arranged at the post-stages, in order to prevent the voltage of the operating signal from propagating to the post-stages resulting from the alienation of the voltage of the operating signal from the power supply voltage/ground voltage, and all the circuit elements configuring the semiconductor integrated circuit are sequentially arranged so that the semiconductor integrated circuit operates stably. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005229051(A) 申请公布日期 2005.08.25
申请号 JP20040038432 申请日期 2004.02.16
申请人 TOSHIBA CORP 发明人 IDAKA YASUHITO
分类号 G06F17/50;H01L21/82;(IPC1-7):H01L21/82 主分类号 G06F17/50
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