发明名称 Semiconductor device gate structure and method of forming the same
摘要 A MOS transistor includes a gate structure extending forrom a semiconductor substrate in a vertical direction is disclosed. The gate structure includes a gate electrode extending from the substrate in a vertical direction, and a gate insulation layer enclosing the gate electrode. A channel pattern encloses the gate insulation layer, and a first conductive pattern extends from a lower portion of the channel pattern in a first direction verticalperpendicular to the channel pattern and in parallel with the substrate. A second conductive pattern extends from an upper portion of the channel pattern in a second direction verticalperpendicular to the channel pattern and in parallel with the substrate. Accordingly, the channel length of the MOS transistor is determined by a distance between the first and second conductive patterns, and a channel width of the MOS transistor is determined by a diameter of the gate structure. Short channel and narrow width effects are sufficiently prevented in a MOS transistor.
申请公布号 US2005184348(A1) 申请公布日期 2005.08.25
申请号 US20050059145 申请日期 2005.02.15
申请人 YOUN JAE-MAN;PARK DONG-GUN;LEE CHOONG-HO;YOSHIDA MAKOTO;LEE CHUL 发明人 YOUN JAE-MAN;PARK DONG-GUN;LEE CHOONG-HO;YOSHIDA MAKOTO;LEE CHUL
分类号 H01L21/28;H01L21/316;H01L21/336;H01L21/8234;H01L21/84;H01L27/12;H01L29/423;H01L29/49;H01L29/78;H01L29/786;(IPC1-7):H01L27/12 主分类号 H01L21/28
代理机构 代理人
主权项
地址