发明名称 Selective solder bump application
摘要 Selective application of solder bumps in an integrated circuit package. Solder bumps are selectively applied in a solder bump integrated circuit packaging process so that portions of a circuit can be effectively disabled. The bumps may be selectively applied either to a die or to the substrate using multiple solder masks, one for each pattern of solder bumps desired or can be otherwise applied in multiple patterns depending upon which portions of the circuitry are to be active and which are to be disabled.
申请公布号 US6933611(B2) 申请公布日期 2005.08.23
申请号 US20030629055 申请日期 2003.07.29
申请人 HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. 发明人 KEVER WAYNE
分类号 H01L21/48;H01L21/66;(IPC1-7):H01L23/48;H01L23/52;H01L29/40;H01L21/44 主分类号 H01L21/48
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