发明名称 Method for patterning a layer of silicon, and method for fabricating an integrated semiconductor circuit
摘要 A hard mask made from polysilicon is used to etch a layer to be patterned. The hard mask is patterned using a resist mask. The etching of the hard mask is carried out in such a way that the openings which are etched into the hard mask have inclined sidewalls. This reduces the cross section of the openings, with the result that smaller openings can be formed in the layer that is to be patterned than the openings which have been predetermined by the resist mask. The hard mask is etched using only HBr. The inclination of the openings etched into the hard mask can be set by way of the TCP power and/or the bias power of a TCP etching chamber, and/or by way of the HBr flow rate.
申请公布号 US6933240(B2) 申请公布日期 2005.08.23
申请号 US20030462512 申请日期 2003.06.16
申请人 INFINEON TECHNOLOGIES AG 发明人 LAZAR LAURA;KRONKE MATTHIAS
分类号 H01L21/033;H01L21/3065;H01L21/60;(IPC1-7):H01L21/302 主分类号 H01L21/033
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