发明名称 |
Electronic component testing socket and electronic component testing apparatus using the same |
摘要 |
To control the temperature of an electronic component testing socket without mixing any noise into a test signal to be applied to an electronic component and a respond signal to be read from the electronic component when conducting a test on the electronic component, a first space 67 in the electronic component testing socket base 6 and a socket body inside space 75 in the electronic component testing socket 7 are connected via a gas outlet 65 and a gas inlet 76 , and a second space 68 in the electronic component testing socket base 6 and a socket body inside space 75 in the electronic component testing socket 7 are connected via a gas inlet 66 and a gas outlet 77. |
申请公布号 |
US6932635(B2) |
申请公布日期 |
2005.08.23 |
申请号 |
US20030455800 |
申请日期 |
2003.06.06 |
申请人 |
ADVANTEST CORPORATION |
发明人 |
ISHIKAWA TAKAJI;NAKAMURA HIROTO |
分类号 |
G01R31/26;G01R1/04;G01R1/06;G01R1/073;G01R31/01;G01R31/28;H01R33/76;(IPC1-7):H01R4/60 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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