发明名称 Method for forming enhanced areal density split gate field effect transistor device array
摘要 A method for forming a floating gate electrode within a split gate field effect transistor device provides for isotropically processing a blanket isotropically processable material layer having a patterned mask layer formed thereover to form a patterned isotropically processed material layer which encroaches beneath the patterned mask layer. The patterned isotropically processed material layer may then be employed as a mask for forming a floating gate electrode from a blanket floating gate electrode material layer. The method provides for forming adjacent floating gate electrodes with less than minimally photolithographically resolvable separation.
申请公布号 US6933198(B2) 申请公布日期 2005.08.23
申请号 US20020326501 申请日期 2002.12.20
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD 发明人 CHU WEN-TING;HSIEH CHIA-TA;LIN CHRONG-JUNG
分类号 H01L21/28;H01L21/8247;H01L27/115;H01L29/423;(IPC1-7):H01L21/824 主分类号 H01L21/28
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