发明名称 Method of manufacturing semiconductor device using STI technique
摘要 A method of manufacturing a semiconductor device including forming a laminate structure which includes a gate insulation film on a semiconductor substrate and a gate electrode material film on the gate insulation film, processing the gate electrode material film to obtain a gate electrode having a reverse tapered cross section, and forming a device isolation insulation film in direct contact with a side surface of the gate electrode.
申请公布号 US6933194(B2) 申请公布日期 2005.08.23
申请号 US20030670249 申请日期 2003.09.26
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 NARITA KAZUHITO;SAKAGAMI EIJI;TSUNODA HIROAKI;SONODA MASAHISA;KOBAYASHI HIDEYUKI
分类号 H01L21/28;H01L21/76;H01L21/762;H01L21/8234;H01L21/8247;H01L27/115;H01L29/423;H01L29/43;H01L29/49;H01L29/788;H01L29/792;(IPC1-7):H01L21/336 主分类号 H01L21/28
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