发明名称 Methods of encapsulating selected locations of a semiconductor die assembly using a thick solder mask
摘要 A solder mask includes an opening through which intermediate conductive elements may be positioned between bond pads of a semiconductor die exposed through an aligned opening in a carrier substrate to which the solder mask is secured and corresponding contact areas of the carrier substrate. An assembly is formed by forming the solder mask on or securing the solder mask to the carrier substrate. The semiconductor die is attached to the carrier substrate such that bond pads of the semiconductor die are exposed through the aligned openings in the carrier substrate and solder mask. Intermediate conductive elements are used to electrically connect the bond pads to corresponding contact areas on the carrier substrate. An encapsulant material is introduced into an area defined by the solder mask and carrier substrate openings such that the intermediate conductive elements and semiconductor die surface within the aligned openings are encapsulated.
申请公布号 US2005181545(A1) 申请公布日期 2005.08.18
申请号 US20050108151 申请日期 2005.04.08
申请人 GRIGG FORD B.;REEDER WILLIAM J. 发明人 GRIGG FORD B.;REEDER WILLIAM J.
分类号 H01L23/13;H01L23/24;H01L23/498;(IPC1-7):H01L21/00;H01L21/44;H01L23/52;H01L21/50;H01L29/40 主分类号 H01L23/13
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