MEMORY ACCESS DEVICE AND SEMICONDUCTOR MEMORY CARD

摘要

PROBLEM TO BE SOLVED: To obtain accurate writing speed information on a memory access device side by measuring a writing time in a semiconductor memory card and transmitting it to the memory access device.

SOLUTION: This semiconductor memory card 1 has a user data area 21 and a management information area 22 in a data storage part. Data are written into a prescribed area of user data by a memory controller 3 on the basis of a writing test command from the memory access device 6, and its speed is measured. A measurement result is transmitted to the memory access device 6 through a host interface 4. Thereby, the writing speed can be recognized on the memory access device 6 side.

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