发明名称 INTEGRATED CIRCUIT DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide an integrated circuit device, provided with a temperature sensor for obtaining satisfactory SNR, and to provide a manufacturing method of the same. SOLUTION: In the temperature sensor 3 for the semiconductor integrated circuit device 1, wires W12 are formed in a wiring layer L3 of the top layer of a multilayer wiring layer M1. Then, between the two wires W12, a sheet-like temperature monitoring member 10, consisting of vanadium oxide, is provided so as to cover the two wires W12. Thus, the temperature-monitoring member 10 is connected between two wires W11 via vias V11 and the wirings W12. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005223297(A) 申请公布日期 2005.08.18
申请号 JP20040032660 申请日期 2004.02.09
申请人 NEC ELECTRONICS CORP;NEC CORP 发明人 KAWAHARA HISAYOSHI;MURASE HIROSHI;OKUBO HIROAKI;KIKUTA KUNIKO;NAKASHIBA YASUTAKA;ODA NAOKI;SASAKI NARIHITO;ITO NOBUKAZU
分类号 H01L21/768;H01C7/10;H01L21/822;H01L23/58;H01L27/04;H01L27/06;H01L27/16;H01L31/058;(IPC1-7):H01L21/822 主分类号 H01L21/768
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