发明名称 Semiconductor device and method for fabricating the same
摘要 A semiconductor device includes: a semiconductor substrate; a first semiconductor region formed in the reverse surface region of the semiconductor substrate and including a first conductivity type impurity; a second semiconductor region formed on the first semiconductor region in the semiconductor substrate and including a second conductivity type impurity; a third semiconductor region formed on the second semiconductor region in the semiconductor substrate and including a first conductivity type impurity; a trench passing through the second and third semiconductor regions and reaching the first semiconductor region; and a gate insulating film formed along the wall face of the trench; a gate electrode formed on the gate insulating film in the trench. Further, a pocket region including a second conductivity type impurity of which peak concentration is higher than that of the second semiconductor region is formed by a side of the trench between the second semiconductor region and the third semiconductor region.
申请公布号 US2005179082(A1) 申请公布日期 2005.08.18
申请号 US20050030945 申请日期 2005.01.10
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 MIYATA SATOE;MIZOKUCHI SHUJI
分类号 H01L29/78;H01L21/265;H01L21/331;H01L21/336;H01L29/10;H01L29/43;H01L29/45;H01L29/739;(IPC1-7):H01L29/43 主分类号 H01L29/78
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