METHOD AND DEVICE FOR DETECTING A TEMPERATURE-DEPENDENT OPERATING PARAMETER OF A COMPONENT

摘要

The invention relates to a test method for detecting a temperature-dependent operating parameter of an electronic component, which is operated in a pulsed manner during normal usage. According to the invention, the component is directly supplied with energy, is heated to the expected operating temperature by the power loss that occurs as a result of said supply and the temperature-dependent operating parameter is subsequently measured.