发明名称 ILLUMINATION SYSTEM FOR A MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS
摘要 <p>An Illumination system for a microlithographic projection expose apparatus has a light source (14) and a first optical raster element (18; 118; 218) that is positioned in or in close proximity to a first plane (24). The first plane is conjugated to a pupil plane (28) of the illumination system (10) by Fourier transformation. A second optical raster (30; 130; 230) element is positioned in or in close proximity to the pupil plane (28). A third optical raster (36; 136; 236) element is positioned in or in close proximity to a second plane (34) that is also con jugated to the pupil plane (28) by Fourier transformation. The third optical raster element (36; 136; 236), which can be a diffractive optical element, introduces an additional degree of design freedom for the modification of the angular distribution of the projection light bundle.</p>
申请公布号 WO2005076083(A1) 申请公布日期 2005.08.18
申请号 WO2004EP01129 申请日期 2004.02.07
申请人 CARL ZEISS SMT AG;SINGER, WOLFGANG;WANGLER, JOHANNES 发明人 SINGER, WOLFGANG;WANGLER, JOHANNES
分类号 G03F7/20;(IPC1-7):G03F7/20 主分类号 G03F7/20
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