发明名称 THIN FILM, METHOD FOR MANUFACTURING P-TYPE ZINC OXIDE THIN FILM AND SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a thin film which materializes a high crystallinity and a surface flatness, and dopes a dopant at a high density. <P>SOLUTION: This method comprises: the low temperature high doped layer growing step of doping the dopant while growing a thin film at a specific first temperature; the annealing step of discontinuing the growth of the thin film to anneal the thin film at a predetermined second temperature higher than the first temperature; and the high temperature low doped layer growing step of growing the thin film at the second temperature. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005223219(A) 申请公布日期 2005.08.18
申请号 JP20040031194 申请日期 2004.02.06
申请人 TOHOKU UNIV 发明人 KAWASAKI MASASHI;OTOMO AKIRA;FUKUMURA TOMOAKI;TSUKASAKI ATSUSHI;OTANI AKIRA
分类号 C30B29/16;H01L21/205;H01L21/363;H01L33/28 主分类号 C30B29/16
代理机构 代理人
主权项
地址