发明名称 |
THIN FILM, METHOD FOR MANUFACTURING P-TYPE ZINC OXIDE THIN FILM AND SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a thin film which materializes a high crystallinity and a surface flatness, and dopes a dopant at a high density. <P>SOLUTION: This method comprises: the low temperature high doped layer growing step of doping the dopant while growing a thin film at a specific first temperature; the annealing step of discontinuing the growth of the thin film to anneal the thin film at a predetermined second temperature higher than the first temperature; and the high temperature low doped layer growing step of growing the thin film at the second temperature. <P>COPYRIGHT: (C)2005,JPO&NCIPI |
申请公布号 |
JP2005223219(A) |
申请公布日期 |
2005.08.18 |
申请号 |
JP20040031194 |
申请日期 |
2004.02.06 |
申请人 |
TOHOKU UNIV |
发明人 |
KAWASAKI MASASHI;OTOMO AKIRA;FUKUMURA TOMOAKI;TSUKASAKI ATSUSHI;OTANI AKIRA |
分类号 |
C30B29/16;H01L21/205;H01L21/363;H01L33/28 |
主分类号 |
C30B29/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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