发明名称 INTERNAL DEFECT DETECTING METHOD FOR STRUCTURE
摘要 PROBLEM TO BE SOLVED: To provide an internal defect detecting method for a structure requiring no new expense for heating or cooling, dispensing with a technique for uniform heating or cooling, and hardly generating a detection error even in a very small temperature difference. SOLUTION: In this internal defect detecting method for the structure wherein a material generating heat in curing is filled in a hollow shell to be cured, a surface temperature distribution in the structure is measured after a prescribed lapse time counted from the start of the filling, and a defect is detected based on the distribution. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005221395(A) 申请公布日期 2005.08.18
申请号 JP20040030111 申请日期 2004.02.06
申请人 SUMITOMO METAL IND LTD 发明人 NAKAGAWA KENICHI;KAMIJO TAKASHI
分类号 G01N25/72;(IPC1-7):G01N25/72 主分类号 G01N25/72
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