发明名称 Manufacturing method of semiconductor device
摘要 This invention provides an etching method for preventing deformation of an opening without extremely lowering productivity. This invention has a process for bonding a supporting board (5) on a front surface of a semiconductor substrate (1) to cover a pad electrode (3) formed on the semiconductor substrate (1) with a silicon oxide film (2) interposed therebetween, a process for forming a via hole from a back surface of the semiconductor substrate (1) to a surface of the pad electrode (3), a process for forming a first opening (8) in the semiconductor substrate (1) to a position where the silicon oxide film (2) is not exposed with using etching gas containing SF6 and O2 at least, and a process for forming a second opening (8) in the semiconductor substrate to a position where the silicon oxide film (2) is exposed with using etching gas containing C4F9 and SF6 at least, <IMAGE>
申请公布号 EP1564805(A1) 申请公布日期 2005.08.17
申请号 EP20050003385 申请日期 2005.02.17
申请人 SANYO ELECTRIC CO., LTD. 发明人 KAMEYAMA, KOUJIRO;SUZUKI, AKIRA;OKAYAMA, YOSHIO
分类号 H01L21/768 主分类号 H01L21/768
代理机构 代理人
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