发明名称 Semiconductor memory device with read and/or write column select gate
摘要 The DRAM drives a bit line pair connected to a read column select gate and a write column select line connected to a write column select gate by a power supply voltage for an array, and drives a read column select line connected to a read column select gate and write data line pair connected to a write column select gate by a power supply voltage for a peripheral circuitry. Hence, even when one power supply voltage becomes high and another power supply voltage becomes low at the same time, the timing margin and operation margin can sufficiently be secured. Thus, a semiconductor memory device allowing a stable high-speed operation with large timing margin and operation margin will be achieved.
申请公布号 US6930940(B2) 申请公布日期 2005.08.16
申请号 US20030678137 申请日期 2003.10.06
申请人 RENESAS TECHNOLOGY CORP. 发明人 HARAGUCHI MASARU
分类号 G11C11/409;G11C7/00;G11C7/10;G11C11/00;G11C11/4076;G11C11/4096;(IPC1-7):G11C7/00 主分类号 G11C11/409
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