发明名称 Strained silicon MOSFETs having NMOS gates with work functions for compensating NMOS threshold voltage shift
摘要 The threshold voltage shift exhibited by strained silicon NMOS devices is compensated with respect to the threshold voltages of PMOS devices formed on the same substrate by increasing the work function of the NMOS gates. The NMOS gate work function exceeds the PMOS gate work function so as to compensate for a difference in the respective NMOS and PMOS threshold voltages. The NMOS gates are preferably fully silicided while the PMOS gates are partially silicided.
申请公布号 US6929992(B1) 申请公布日期 2005.08.16
申请号 US20030738496 申请日期 2003.12.17
申请人 ADVANCED MICRO DEVICES, INC. 发明人 DJOMEHRI IHSAN J.;XIANG QI;GOO JUNG-SUK;PAN JAMES N.
分类号 H01L21/28;H01L21/8238;H01L21/84;H01L27/12;H01L29/49;H01L29/786;(IPC1-7):H01L21/823 主分类号 H01L21/28
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